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Home : Equipment > Pulse Generators > DG2040
Tektronix DG2040 Data Pattern Generator

Data Pattern Generator

Product Status: New / Refurbished
List Price: $13,990
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Download project datasheet details pdf file  Download Datasheet
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SPECIFICATIONS

The DG2000 Series of pattern generators provide digital designers with the high performance tools needed to evaluate advanced digital semiconductors and logic circuits. Whatever you call your design process - characterization, debug, validation or verification - as a digital designer you must have a state-of-the-art digital pattern generation as you push the edge of the technology envelope and race to market.

Each DG2040 complementary output generates data rates up to 1.1 Gb/s. The DG2040 defines high performance with <150 ps transition times, 10 ps delay timing resolution and programmable output levels of 250 mVp-p to 2.5 Vp-p (-1.125 mV to +3.5 V) in 5 mV steps. Pattern edges can be moved ±100 ps in 5 ps steps or modulated by an external source. SMA connectors are used for each complementary output channel and clock output. Figure 2 illustrates a number of adjustable signal parameters.
  • Data Rate to 1.1 Gb/s Tests High-speed Logic Devices and Circuits
  • Data Pattern Depth to 256 K/channel Speeds Characterization
  • Multiple Output Channels Increases Flexibility
    • DG2040: 2
    • DG2030: 4 or 8
  • Control of Edge Timing (DG2040) Permits Jitter Simulation in Serial Data Streams
  • Precise Control of Output Parameters Include:
    • Variable Output Delay
    • Variable Output Level
    • Variable Rise and Fall Time Control (DG2030)
    • Tri-state Output Control (DG2030)
  • Fast Transition Times to 150 ps (DG2040) Aids Fast Logic Evaluation
  • Complementary Output (DG2040) Assures Excellent Signal Fidelity
  • Flexible Sequence Control with Jump, Event and Nested Loops
  • Large Display for Easy-to-Use Data Editing
  • Import Pattern Data with DG-link Software Utility
  • Integrate into ATE Systems via GPIB/RS-232-C Interface

Applications:

  • Ultra Low Jitter for Clock Substitution
  • Characterize Device Timing for TTL, CMOS, ECL Families
  • Simulate Missing Functions in System or Subsystem Evaluation
  • Create Complex Data Patterns with Sophisticated Sequence, Looping, Jump on Event and Tri-state Output Control
  • Characterize and Verify ASIC, FPGA and DACs
  • Evaluate Media Storage Devices and Components (HDD, FDD, ODD, DVD)
  • Test Printer Engines or LCD Display Drivers
  • Construct Logic Verification Systems Utilizing Tektronix Oscilloscopes or Logic Scopes
  • Use in Conjunction with TLA Logic Analyzer to Provide Digital Stimulus
AVAILABLE EQUIPMENT OPTIONS
1R Rackmount

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