Validating signal quality is an important part of any embedded system design. One way to determine how well your signals conform to expected signal quality is to use mask testing. A mask defines a portion, or portions, of the oscilloscope display that a signal must not enter. Whether you need to test to a well-defined telecommunication or computer standard or are interested in validating how your signals are performing compared to a known good condition, the DPO4LMT Limit and Mask Test Application Module for the MDO4000, MSO/DPO4000B, and MSO/DPO4000 Series provides instant automated statistical analysis of signal quality. The Limit and Mask Test capability makes testing against telecommunication and computer industry standards easy by making mask definition quick and accurate, allowing flexible testing configurations, and providing detailed statistical test results.

• Conduct Limit Test Pass/Fail Testing against a “Golden” Waveform with Tolerances
• Perform Mask Testing on ITU-T, ANSI T1.102, and USB Standards
• Perform Mask Testing on Custom User-defined Masks
• Detailed Test Statistics provide Insight into True Signal Behavior
• Customizable Tests allow for Multiple Actions upon Violations or Test Failures
• High Waveform Capture Rates enable Thousands of Waveforms to be Tested per Second