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The single-channel Model 2635 and dual-channel Model 2636 are the newest members of Keithley's Series 2600 family of multi-channel I-V test solutions. With 1fA measurement resolution, the Models 2635 and 2636 are optimized for applications that require low current sourcing and measurement capabilities and are the ideal choice for your next semiconductor parametric analysis and test system. Like the rest of the Series 2600 family, each half-rack, 2U instrument combines a precision power supply, a true current source, 5˝-digit multimeter, a voltage or current pulse generator with measurement, a low frequency arbitrary waveform generator, an electronic load, and a trigger controller.
- Combines a precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller — all in one instrument
- 10,000 readings/s and 5,500 source-measure points/s to memory provide faster test times
- Embedded Test Script Processor (TSP™) offers unparalleled system automation and two to four times the test throughput of competitive products in I-V functional test applications
- Family of products offers wide dynamic range: 1fA to 10A and 1µV to 200V
- TSP-Link™ master/slave connection seamlessly integrates multiple Series 2600 SourceMeter channels into a system that can be programmed and controlled as a single instrument
- Free Test Script Builder software simplifies creating powerful test scripts for programming custom test functions
- Free LabTracer™ 2.0 software available for curve tracing and fast, easy startup
- Each SourceMeter channel is electrically isolated for high integrity measurements and wiring flexibility
- Industry's highest SMU rack density for automated test applications
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