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The TDS8000B Digital Sampling Oscilloscope offers the widest range of on-board measurement and waveform-processing capabilities of any ultra-high bandwidth oscilloscope. With excellent measurement repeatability, exceptional vertical resolution and fast waveform acquisition and display update rates, the TDS8000B is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages, cables and high-speed digital communications. - DC to 70+ GHz Bandwidth*1
- Exceptional Trigger Jitter and Horizontal Timebase Stability
- Modular Architecture
- Up to Eight Channels Acquisition
- High Resolution and Measurement Repeatability
- Comprehensive, Accurate, Automatic Measurement System
- Intuitive User Interface
- Large Display (10.4 in.)
- Microsoft Windows-based Graphical User Interface
- Windows 2000 for enhanced network security
Applications: - Semiconductor Testing
- Impedance and Crosstalk Characterization (using TDR)
- High-speed Digital Data Communications
*1 Bandwidth is determined by plug-in modules and may exceed 70 GHz should higher speed modules become available in the future.
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