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The AWG710 combines world-class signal fidelity with ultra high-speed mixed signal simulation, a powerful sequencing capability and graphical user interface with flexible waveform editor, to solve the toughest measurement challenges in the disk drive, communications and semiconductor design/test industries. -
Simulates Real-world Signals Up To 2.0 GHz -
2 Markers With 1.6 ps RMS Jitter Deliver Ultra-stable Timing to the Device-under-test (DUT) -
16 M or 32 M Point Record Length Provide Longer Serial or Rotational Media Data Streams -
8-bit Vertical Resolution for Precise Signal Replication -
Analog Bandwidth to 2 GHz (Option 02, Calculated Based on Rise Time) Provides the Highest Signal Fidelity of All High-speed AWGs EZ Function Generator Mode Allows Quick Creation and Edit of Sine, Square, Triangle, Ramp, Pulse and DC Waveforms -
Waveform Quick Editor with 300 fs Edge Timing Resolution Delivers Output Edge Control with Near Real-time Precision -
Real-time Sequencing Creates Infinite Waveform Loops, Jumps, Patterns and Conditional Branches -
GPIB and LAN (10/100Base-T) Interfaces Applications: -
Disk Drive Read/Write Design and Test -
Communications Design and Test - – Arbitrary IF Baseband Signals
- – Standard Waveforms for Communications
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Pulse Generation -
– High-speed, Low-jitter -
Data and Clock Source -
Mixed Signal Design and Test -
Real-world Simulations -
– Corruption and Enhancement of Ideal Waveforms -
– Timing and Amplitude Signal Impairments -
– Waveforms Imported from MathCad, MATLAB, Excel and Others
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