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The Model 2430-C 1kW Pulse SourceMeter® offers the same DC source and measurement ranges as the Model 2425 100W SourceMeter, plus a unique 1kW pulse mode that extends the upper current limit to 10A. This mode makes the Model 2430-C ideal for measuring the breakdown voltage of many types of high-power devices, including multi-layer varistors (MLVs) and semiconductor components. During production testing of these devices, breakdown voltage is often measured under a high current pulse of up to 10A. The Model 2430-C combines programmable bipolar voltage and current sourcing of up to 10A @ 100V (pulsed) with all the high-speed testing capabilities common to the Series 2400 family. The Model 2430-C can be programmed to produce individual pulses or pulse trains up to 5ms wide and with varying duty cycle on most source ranges. Pulses up to 2.5ms long and an 8% duty cycle can be programmed on the instrument's 1kW range. When combined with a PC controller and the appropriate switching hardware, the Model 2430-C provides an economical, high-throughput solution for high-power device testing, all in one compact, half-rack box. Other solutions offering compatible capabilities, such as discrete semiconductor component testers, typically cost four times as much as the Model 2430-C and require significantly more rack space. The Contact Check function makes it simple to maximize test integrity by verifying test connections easily in just 350µs before an automated test sequence begins. This eliminates measurement errors and false product failures associated with contact fatigue, breakage, contamination, loose or broken connection, relay failures, etc.
- Completes the contact check verification and notification process in just 350µs to maintain high speed production throughput
- Contact Check enabled on the instrument's front panel or remotely via the GPIB
- 1kW source capability in a half-rack box saves cost and rack space
- Built-in "Source Memory" programmable sequencer stores up to 100 different tests for high production throughput
- Rugged design with 75,000-hour MTBF provides reliability in non-stop production environments.
- Built-in comparator simplifies pass/fail testing
- Digital I/O for fast binning or connection to component handlers
- 0.012% basic accuracy with 5-1/2-digit resolution for precise measurements
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