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The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests. The 4200-SCS Semiconductor Characterization System has a Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond.
Optional Instrumentation:
- Model 4225-PMU Ultra-Fast I-V Module
- Model 4220-PGU Pulse Generator Unit (Voltage-Source only)
- Model 4225-RPM Remote Amplifier/Switch
- Model 4200-SMU Medium Power Source-Measure Unit
- Model 4210-SMU High Power Source-Measure Unit for 4200-SCS
- Model 4200-PA Remote PreAmp Option for 4200-SMU and 4210-SMU
- Model 4210-CVU 1kHz - 10MHz Capacitance Voltage Measurement Unit
- Model 4200-SCP2 Dual-Channel Oscilloscope Card
- Model 4200-SCP2HR 200MS Dual-Channel Oscilloscope Card
Ultra-Fast I-V Application Package:
Features:
- Intuitive, point-and-click Windows®-based environment
- Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
- C-V instrument makes C-V measurements as easy as DC I-V
- Pulse and pulse I-V capabilities for advanced semiconductor testing
- Scope card provides integrated scope and pulse measure functionality
- Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
- Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
- Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
- Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
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