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Home : Equipment > Semiconductor Parameter A > 4200-SCS
Keithley 4200-SCS Semiconductor Characterization System

Semiconductor Characterization System

Product Status: New / Refurbished
List Price: $0
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SPECIFICATIONS

The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests. The 4200-SCS Semiconductor Characterization System has a Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond.
 
Optional Instrumentation:
  • Model 4225-PMU Ultra-Fast I-V Module
  • Model 4220-PGU Pulse Generator Unit (Voltage-Source only)
  • Model 4225-RPM Remote Amplifier/Switch
  • Model 4200-SMU Medium Power Source-Measure Unit
  • Model 4210-SMU High Power Source-Measure Unit for 4200-SCS
  • Model 4200-PA Remote PreAmp Option for 4200-SMU and 4210-SMU
  • Model 4210-CVU 1kHz - 10MHz Capacitance Voltage Measurement Unit
  • Model 4200-SCP2 Dual-Channel Oscilloscope Card
  • Model 4200-SCP2HR 200MS Dual-Channel Oscilloscope Card
Ultra-Fast I-V Application Package:
  • Model 4225-PMU Ultra-Fast I-V Module

Features:

  • Intuitive, point-and-click Windows®-based environment
  • Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
  • C-V instrument makes C-V measurements as easy as DC I-V
  • Pulse and pulse I-V capabilities for advanced semiconductor testing
  • Scope card provides integrated scope and pulse measure functionality
  • Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
  • Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
  • Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
  • Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators
AVAILABLE EQUIPMENT OPTIONS
4200~FLASH Memory Test Package Non-volatile
4200~PIV~A Pulse I-V Solution Bundle Complete Pulse I-V Package for leading edge CMOS. Includes 4205-PG2, 4200-SCP2, Special Interconnect Cables and PIV Software.
4200~PIV~Q Pulse I-V Solution Bundle Pulse I-V Package with Q point and dual-channel pulsing. Includes 4205-PG2, 4200-SCP2HR, Special Interconnect Cables and QPIV Software.
4200~SCP2 Digital Oscilloscope Dual-Channel
4200~SCP2~ACC Optional Scope Probe Dual Channel Digital Oscilloscope Accessory Kit
4200~SCP2HR Integrated Oscilloscope High Resolution, Dual Channel
4205~PG2 Pulse Generator Dual-Channel
4210~CVU Integrated C-V Instrument 1KHZ-10MHZ Capacitance Voltage Measurement Unit

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