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The 11801C Digital Sampling Oscilloscope offers the widest range of on-board measurement and waveform processing capabilities of any multi-Gigahertz scope. With excellent measurement repeatability, exceptional vertical resolution, and fast display update rate, the 11801C is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages and cables, and high-speed digital data communications.
The modular microprocessor-based architecture of the 11801C not only allows you to select the right configuration for your application, but also allows expandability to meet your future measurement needs. The 11801C accepts up to 4 dual-channel sampling heads and can be expanded through the SM-11 Multichannel Units to 136 channels. There are currently nine sampling heads to choose from:
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SD-14 - 3-GHz high-impedance (100 kilohm/0.475 pF) dual-channel probe sampler
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SD-20 - 20-GHz single-channel loop-through head
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SD-22 - 12.5-GHz dual-channel low-noise head
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SD-24 - 20-GHz dual-channel TDR/sampling head
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SD-26 - 20-GHz dual-channel sampling head
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SD-32 - 50-GHz, single-channel sampling head
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SD-42 - 6.4-GHz O/E converter (55-ps optical pulse response FWHM)
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SD-44 - 15-GHz O/E converter
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SD-51 - 20-GHz trigger head
Features:
- DC To 50-Ghz Bandwidth
- 7-ps Rise Time
- Eight Channels, Expandable to 136 (with SM-11 multichannel units)
- High Resolution and Measurement Repeatability
- 10-Femtosecond Sampling Interval (0.01 ps)
- Modular Architecture
- Dual-Timebase Allows Multiple Windows
- FFT
- Predefined Telecom Masks
- True Dual-Step Differential TDR
- Fully Automatic Jitter and Noise Measurements
- Automatic Statistical Measurements, Histograms, and Mask Testing
- Automatic Pulse Measurements with Statistics
- Comprehensive Waveform Processing
- Complete Programmability for ATE Applications
- Color Display with Color Grading
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