The 370B, the world standard for high-resolution curve tracers, provides up to 20 A/2,000 V sourcing capability combined with 1 pA and 50 μV measurement resolution. The 370B performs DC parametric characterization of integrated circuits, transistors, thyristors, diodes, SCRs, MOSFETs, electro-optic components, solar cells, solidstate relays and other semiconductor devices. It has push button source and measurement configuration so it’s easy to change from one test to the next.
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