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The Agilent 71612C error performance analyzer is the ideal solution for the research, development and manufacturing test of Gbit lightwave and digital components, devices and subsystems from 100 Mb/s to 12.5 Gb/s. With this high performance serial pattern generator and error detector, you can perform error analysis to verify the operation and quality of lightwave submarine cable systems, SONET/SDH telecom and datacom transceivers, Gbit datacom serial links, high-speed logic devices, and optical amplifiers and modulators. The analyzer can be used to test 10.6 Gbit ethernet and forward error correction (FEC) rates giving you a breadth of applications to help you thoroughly test and characterize your devices for complete confidence in your product. The four sub-rate outputs of the 71612C are suitable for the generation of 3.125 Gb/s test patterns required to test the XAUI interface of 10 Gigabit Ethernet devices. What's more, the 'alternate pattern mode' of operation allows synchronous selection of the de-skew and data patterns.
- Generate exceptional waveforms even with reflective or poor terminations
- Dedicate the analyzer's whole display for pattern editing
- Simulate long distance testing using burst-mode gating in re-circulating loop tests
- Quickly locate the optimum decision point in the eye waveform with auto-decision thresholds and phase alignment
- Identify individual errored bits in custom patterns using error location analysis (ELA)
- Display any bit in a custom pattern using the flexible pattern trigger
- Automatically predict conventionally unmeasurable low BER using Q-factor measurement and eye-contour analysis
- Generate real-life test patterns to stress your system-under-test
- Create a cost effective 12.5 Gb/s frequency agile jitter measuring system
- Convert electrical-to-optical and optical-to-electrical signals that are SONET/SDH compliant
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