The AWG400 Series performs a wide range of modulated (I&Q) and mixed signal simulations (analog & digital) for wireless and wired data communication, in addition to semiconductor device characterization.

The AWG400 is ideal for design or manufacturing test engineers who need to replicate marginal and erroneous mixed signal conditions. The only product in its class offering 200 MS/s, 16-Bit vertical resolution, 1, 2 or 3 channel configurations and optional digital outputs (16, 32 or 48), the AWG400 is a superior choice for those who need an additional channel, longer memory or higher vertical resolution. The color display, graphical user interface and stand-alone Microsoft Windowsbased waveform creating utility supports quick creation, editing and output of custom or imported waveforms.

• 2 or 3 Independent Waveform Channels
• 16-Bit Vertical Resolution
• 200 MS/s Sample Rate
• Up to 16 M Point Record Length
• Optional 32/48-Bit 100 MHz (CMOS) Digital Data Generator for Mixed-signal Device Testing
• 4 or 6 Digital Marker Outputs
• Independent Channel Internal Noise Generator
• Independent Channel Skew Control
• Independent Channel External Signal ADD-INPUT
• External Clock and External Reference Inputs