Five different styles of tips make probing easier then ever. In addition to a traditional Straight Tip, a Sharp Tip allows easier access to tightly-packed test points and circuit vias. The Bent Sharp Tip — made out of titanium — is ideal for making contact on devices that are spaced close together and prevent the probe from being oriented perpendicular to the circuit. The IC Lead Tip has insulation on one side so it can be wedged between small-geometry IC leads without shorting the test points. The Discrete SMD Tip is designed to fit tightly on surface mount capacitors, resistors and other components.In conjunction with these innovative probe tips is the LeCroy FreeHand probe holder, which holds the probe on test points. This means several probes can be used at the same time on a variety of test points while maintaining short signal paths to preserve signal fidelity. The end result of “HFP hands-free probing” is the enhanced ability to analyze waveforms instead of focusing on keeping the probe in place.In addition to these new attachment techniques, traditional IC clips, wire leads, and square pin adapters are available.
